| SpectraBase Spectrum ID |
CHUOERVLOQL |
| Name |
EPOXYCYCLOHEXYLETHYLTRIMETHOXYSILANE |
| Source of Sample |
Petrarch Systems, Inc. |
| Boiling Point |
310C |
| Classification |
COMPOUNDS CONTAINING SILICON |
| Copyright |
Copyright © 1980, 1981-2025 John Wiley & Sons, Inc. All Rights Reserved. |
| Density |
(Specific Gravity)= 1.07 |
| Flash Point |
(CC) 146C |
| Formula |
C11H22O4Si |
| InChI |
InChI=1S/C11H22O4Si/c1-12-16(13-2,14-3)7-6-9-4-5-10-11(8-9)15-10/h9-11H,4-8H2,1-3H3 |
| InChIKey |
DQZNLOXENNXVAD-UHFFFAOYSA-N |
| Instrument Name |
Bio-Rad FTS 175C with Raman accessory |
| Molecular Weight |
246.38 |
| Optical Properties |
Index of Refraction= (20C) 1.449 |
| Raman Corrections |
Referenced to internal white light source; Baseline subtracted |
| Raman Laser Source |
Nd:YAG |
| Synonyms |
C-E6250
EPOXY CYCLOHEXYLETHYLTRIMETHOXY SILANE |
| Technique |
FT-Raman |
![[2-(7-oxabicylo[4,1,0]hept-3-yl)ethyl]trimethoxysilane](/api/spectrum/CHUOERVLOQL/structure.png?h=300&w=458 "[2-(7-oxabicylo[4,1,0]hept-3-yl)ethyl]trimethoxysilane")
